Noncontact evaluation of the conductivity of CuPc thin films by near-field microwave microprobe method

Authors

  • Enkhtur Lkhamsuren
  • Galbadrakh Ragchaa

DOI:

https://doi.org/10.22353/physics.v15i309.255

Keywords:

CuPc, annealing, conductivity, intrinsic impedance, near-field, microwave microprobe

Abstract

Abstract
The conductivity of copper II phthalocyanine (CuPc) thin films with different crystal structures and
morphologies was evaluated by using a near-field microwave microprobe (NFMM) technique in the
frequency range of 4-4.5 GHz. CuPc thin films annealed at 200 °C and 350 °C showed the a- and yS-phase
crystal structures, respectively. Crystal phase structure and morphology of CuPc thin films were
characterized by optical absorption spectra measurement, X-ray diffraction, and scanning electron
microscopy methods. Conductivity measurements of CuPc thin films were done in the temperatures range
of25-160 °C.

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Published

2022-03-15

How to Cite

Lkhamsuren, E., & Ragchaa, G. (2022). Noncontact evaluation of the conductivity of CuPc thin films by near-field microwave microprobe method . Scientific Transaction of the National University of Mongolia. Physics, 15(309), 23–29. https://doi.org/10.22353/physics.v15i309.255

Issue

Vol. 15 No. 309 (2009): Физик

Section

Research article

License

Copyright (c) 2022 Физик сэтгүүл

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