Noncontact evaluation of the conductivity of CuPc thin films by near-field microwave microprobe method

Abstract

Abstract
The conductivity of copper II phthalocyanine (CuPc) thin films with different crystal structures and
morphologies was evaluated by using a near-field microwave microprobe (NFMM) technique in the
frequency range of 4-4.5 GHz. CuPc thin films annealed at 200 °C and 350 °C showed the a- and yS-phase
crystal structures, respectively. Crystal phase structure and morphology of CuPc thin films were
characterized by optical absorption spectra measurement, X-ray diffraction, and scanning electron
microscopy methods. Conductivity measurements of CuPc thin films were done in the temperatures range
of25-160 °C.