Ion beam excitation of TXRF yield

Authors

  • Egorov V.K IRE RAS
  • Egorov E.V IRE RAS
  • Afanas M.S IRE RAS

DOI:

https://doi.org/10.22353/physics.v20i438.118

Abstract

The work presents short discussion of TXRF and PIXE methods peculiarities. Taking into account of these peculiarities we realized the experimental scheme for TXRF measurements at ion beam excitation of characteristical fluorescence. The scheme is built on base of the planar X-ray waveguideresonator with specific design. Features of the new experimental method and parameters of ion beam
analytical complex Sokol-3 used for the method realization are discussed.

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Published

2022-03-13

How to Cite

V.K, E., E.V, E., & M.S, A. (2022). Ion beam excitation of TXRF yield . Scientific Transaction of the National University of Mongolia. Physics, 20(438), 21–24. https://doi.org/10.22353/physics.v20i438.118

Issue

Vol. 20 No. 438 (2015): Физик

Section

Research article

License

Copyright (c) 2022 Физик сэтгүүл

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.